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Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

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  • ISBN-13: 9780521554909
  • Publisher: Cambridge University Press
  • Release Date: Jul 24, 2000
  • Edition: 1
  • Pages: 406 pages
  • Dimensions: 0.94 x 9.72 x 6.85 inches


This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of new superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunneling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is also discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This book will interest graduate students and researchers in condensed matter physics and material science.

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