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Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)

Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)

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  • ISBN-13: 9789048173037
  • Publisher: Springer
  • Release Date: Nov 23, 2010
  • Edition: Softcover reprint of hardcover 1st ed. 2007
  • Pages: 255 pages
  • Dimensions: 0.65 x 9.25 x 6.1 inches

Overview

This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.


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