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Thermal Testing of Integrated Circuits

Thermal Testing of Integrated Circuits

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  • ISBN-13: 9781441952875
  • Publisher: Springer
  • Release Date: Sep 21, 2011
  • Edition: Softcover reprint of the original 1st ed. 2002
  • Pages: 204 pages
  • Dimensions: 0.51 x 9.25 x 6.1 inches

Overview

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.


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